SCIENTIFIC PUBLICATIONS

PROF. DR. A. WUCHER

156.	Investigations of molecular depth profiling with dual beam sputtering Lu, C., Wucher, A., Winograd, N.,
155.	Ionization probabilities of sputtered indium atoms under atomic and polyatomic Aum- ion bombardment Samartev, A: V., Heuser, C., Wucher, A.,
154.	A statistical approach to molecular delta layer depth profiling Wucher, A. , Kranztman, KD, Lu, C., Winograd, N.,
153.	Temperature effects in the sputtering of a molecular solid by energetic atomic and cluster projectiles Brenes, D, A.,Willingham D, Winograd, N, Wucher, A,
152.	Fluid Flow and Effusive Desorption: Dominant Mechanisms of Energy Dissipation after Energetic Cluster Bombardment of Molecular Solids Brenes, D., A., Garrison, B., J., Winograd, N., Postawa, Z., Wucher, A.,Blenkinsopp, P.,
151.	Molecular Depth Profiling of Buried Lipid Bilayers Using C60-Secondary Ion Mass Spectrometry Lu, C., Wucher, A., Winograd, N., Anal Chem. 83 1 (2011) 351-358
156.	Investigations of molecular depth profiling with dual beam sputtering Lu, C., Wucher, A., Winograd, N.,
155.	Ionization probabilities of sputtered indium atoms under atomic and polyatomic Aum- ion bombardment Samartev, A: V., Heuser, C., Wucher, A.,
154.	A statistical approach to molecular delta layer depth profiling Wucher, A. , Kranztman, KD, Lu, C., Winograd, N.,
153.	Temperature effects in the sputtering of a molecular solid by energetic atomic and cluster projectiles Brenes, D, A.,Willingham D, Winograd, N, Wucher, A,
152.	Fluid Flow and Effusive Desorption: Dominant Mechanisms of Energy Dissipation after Energetic Cluster Bombardment of Molecular Solids Brenes, D., A., Garrison, B., J., Winograd, N., Postawa, Z., Wucher, A.,Blenkinsopp, P.,
150.	Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C60) cluster ions Lu, C., Wucher, A., Winograd, N., Surf. Interface Anal. . 43 1-2 (2011) 99
149.	Fundamental studies of molecular depth profiling using organic delta layers as model systems Lu, C., Wucher, A., Winograd, N., Surf. Interface Anal. . 43 1-2 (2011) 81
143.	Investigating the fundamentals of molecular depth profiling using strong-field photoionization of sputtered neutrals, Willingham D,
142.	A statistical model describing delta layer sputter depth profiles Wucher, A. , Kranztman, KD, Surface and Interface Analysis (2011)
141.	Retrospective sputter depth profiling using 3D mass spectral imaging techniques Zheng,L., Wucher,A.; Winograd N., Applied Surface Science (2011), 41
140.	Predicting Kinetic Electron Emission in MD-Simulations of Atomic Collision Cascades Duvenbeck,A; Wucher,A. Physical Review B, (2010), 5715-5720
139.	Fluence Effects in C60 bombardment of Silicon Krantzman,K.D.; Wucher,A., Journal of Physical Chemistry C, (2010), 5480-5490 full pdf file
138.	Influence of the polar angle of incidence on secondary ion formation in self-sputtering silver Weidtmann,B.; Hanke,S.; Duvenbeck,A; Wucher,A., Surface and Interface Analysis, full pdf file
137.	Strong field photoionization of neutrals and the fundamentals of molecular depth profiling Willingham,D.; Wucher,A.; Winograd,N., Journal of Chemical Physics, (2010), 5391-5399 full pdf file
136.	Kinetic excitation of solids induced by energetic particle bombardment: Influence of impact angle Heuser,C.; Marpe,M.; Diesing,D.; Wucher,A., Nuclear Instruments & Methods in Physics Research B., (2009), 601-604 full pdf file
135.	The influence of projectile charge state on ionization probabilities of sputtered atoms Meyer,S.; Wucher,A. Nuclear Instruments & Methods in Physics Research B, (2009), 646, 648 full pdf file
134.	HICS: Highly charged ion collisions with surfaces Peters,T.; Haake,C.; Hopster,J.; Sokolovsky,V.; Wucher,A.; Schleberger,M. Nuclear Instruments & Methods in Physics Research B, (2009), 687-690 full pdf file
133.	Crystallographic effects in the kinetic excitation of metal surfaces: A computational study Weidtmann,B.; Duvenbeck,A.; Hanke,S.; Wucher,A., Nuclear Instruments & Methods in Physics Research B, (2009), 598-600 full pdf file
132.	Molecular sputter depth profiling using carbon cluster beams Wucher,A.; Winograd,N., (2010), Analytical and Bioanalytical Chemistry, 105-114 full pdf file
131.	Retrospective sputter depth profiling using 3D mass spectral imaging techniques Zheng,L.; Wucher,A.; Winograd,N., (2011), Surface and Interface Analysis 43, 41-44 full pdf file
130.	Predicting Secondary Ion Formation in Molecular Dynamics Simulations of Sputtering Weidtmann,B.; Duvenbeck,A; Wucher,A., (2008), Applied Surface Science 813-815 full pdf file
129.	Three-dimensional Molecular Imaging using Mass Spectrometry and Atomic Force Microscopy Wucher,A.; Cheng,J.; Zheng,L.; Willingham,D.; Winograd,N.,(2008), Applied Surface Science, 984-986 full pdf file
128.	On the internal energy of sputtered clusters A. Wucher, C. Staudt, S. Neukermans, E. Janssens, F. Vanhoutte, R.E. Silverans, P. Lievens, New J. Phys.10 (2008), 103007-103007-22 full pdf file
127.	Molecular Depth Profiling using a C60 Cluster Beam: the Role of Impact Energy A. Wucher, J. Cheng and N. Winograd, Anal. Chem. 112 2008, 16550-16555 full pdf file
126.	A simple erosion dynamics model of molecular sputter depth profiling A. Wucher, Surf. Interf. Anal.40 (2008), 1545-1551 full pdf file
125.	Kinetic electron excitation of solids induced by fast particle bombardment S. Meyer, C. Heuser, D. Diesing and A. Wucher, Phys. Rev. B 78 (2008), 035428 (1-13) full pdf file
124.	Molecular depth profiling of trehalose using a C60 cluster ion beam A. Wucher, J. Cheng and N. Winograd, Appl. Surf. Sci. 255 (2008), 959-961 full pdf file
123.	Fundamental Studies of Molecular Depth Profiling and 3-D Imaging using Langmuir-Blodgett Films as a Model L. Zheng, A. Wucher and N. Winograd, Appl. Surf. Sci. 255 (2008), 816-818 full pdf file
122.	Depth resolution during C60^+ profiling of multilayer molecular films L. Zheng, A. Wucher and N. Winograd, Anal. Chem. 80 (2008), 7363-7371 full pdf file
121.	Modeling hot electron generation induced by electron promotion in atomic-collision cascades in metals A. Duvenbeck, B. Weidtmann, O. Weingart and A. Wucher, Phys. Rev. B 77 (2008) 245444 (1-7) full pdf file
120.	Hot electrons induced by cold multiply charged ions T. Peters, C. Haake, D. Diesing, D. Kovacs, A. Golczewski, G. Kowarik, F. Aumayr, A. Wucher and M. Schleberger, New J. Phys. 10 (2008), 073019 (1-8) full pdf file
119.	Formation of atomic secondary ions in sputtering A. Wucher, Appl. Surf. Sci. 255 (2008), 1194-1200 full pdf file
118.	Predicting secondary ion formation in molecular dynamics simulations of sputtering B. Weidtmann, A. Duvenbeck and A. Wucher, Appl. Surf. Sci 255 (2008), 813-815 full pdf file
117.	Energy Deposition during Molecular Depth Profiling Experiments with Cluster Ion Beams J. Kozole, A. Wucher and N. Winograd, Anal. Chem. 80 (2008), 5293-5301 full pdf file
116.	Potential electron emission induced by multiply charged ions in thin film junnel junctions D. A. Kovacs, T. Peters, C. Haake, M.Schleberger, A. Wucher, A. Golczewski, F. Aumayr, D. Diesing, Phys. Rev. B 77 (2008) 77 245432 (1-11) full pdf file
115.	Photo and particle induced transport of excited carriers in thin film tunnel junctions D. A. Kovacs, J. Winter, S. Meyer, A. Wucher and D. Diesing, Phys. Rev. B 76(2007) 235408 (1-12) full pdf file
114.	Protocols for Three-Dimensional Molecular Imaging using Mass Spectrometry A. Wucher, J. Cheng and N. Winograd, Anal. Chem. 79 (2007) 5529-5539 full pdf file
113.	The role of electronic friction of low-energy recoils in atomic collision cascades A. Duvenbeck, O. Weingart, V. Buss, A. Wucher, Nucl. Instr. Meth. B. 258 (2007) 83-86 full pdf file
112.	Electron promotion and electronic friction in atomic collision cascades A. Duvenbeck, O. Weingart, V. Buss, A. Wucher, New J. Phys. 9 (2007) 38 (1-19) full pdf file
111.	On the role of electronic friction and electron promotion in kinetic excitation of solids A. Duvenbeck, O. Weingart, V. Buss, A. Wucher, Nucl. Instr. Meth. B. 255 (2007) 281-285 full pdf file
110.	Sputtering: Experiment A. Wucher, K. Dan. Vidensk. Selsk, Mat. Fys. Medd. 52 (2007) 405-432 full pdf file
109.	Kinetic excitation of solids: The concept of electronic friction M. Lindenblatt, E. Pehlke, A. Duvenbeck, B. Rethfeld, A. Wucher, Nucl. Instr. Meth. B. 246 (2006) 333-339 full pdf file
108.	Molecular secondary ion formation under cluster bombardment: A fundamental review A. Wucher, Appl. Surf. Sci. 252 (2006) 6482-6489 full pdf file
107.	Kinetic energy distributions of neutral In and In2 sputtered by polyatomic ion bombardment A.V. Samartsev and A. Wucher, Appl. Surf. Sci. 252 (2006) 6470-6473 full pdf file
106.	Chemically alternating Langmuir-Blodgett thin films as a model for molecular depth profiling by mass spectrometry J. Zheng, A. Wucher and N. Winograd, J. Am. Soc. Mass. Spectrom. 19 (2007) 96-102 full pdf file
105.	Molecular Depth Profiling with Cluster Ion Beams J. Cheng, A. Wucher and N. Winograd, J. Phys. Chem. B. 110 (2006) 8329-8336 full pdf file
104.	Yields and ionization probabilities of sputtered Inn particles under atomic and polyatomic Aum ion bombardment A.V. Samartsev and A. Wucher Appl. Surf. Sci. 252 (2006) 6474-6477 full pdf file
103.	Determination of energy dependent ionization probabilities for sputtered particles P. Mazarov, A.V. Samartsev and A. Wucher, Appl. Surf. Sci. (2006) 6452-6455 full pdf file
102.	Low energy electronic excitation in atomic collision cascades: a nonlinear transport model A. Duvenbeck and A. Wucher, Phys. Rev. B 72 (2005) 165408 (1-9) full pdf file, suppl. material
101.	Energetic Ion Bombardment of Ag Surfaces by C^+60 and Ga^+ Projectiles S. Sun, C. Szakal, A. Wucher and N. Winograd, J. Am. Soc. Mass. Spectrom. 16 (2005) 1677-1686 full pdf file
100.	Laser post-ionization secondary neutral mass spectrometry for ultra-trace analysis of samples from space return missions I.V. Veryovkin, W.F. Calaway, C.E Tripa, J.F. Moore, A. Wucher, M.J. Pellin, Nucl. Instrum. Methods B 241 (2005) 356-360 full pdf file
99.	Sputtering of Indium using Aum Projectiles: Transition from Linear Cascade to Spike Regime A.V. Samartsev, A. Duvenbeck and A. Wucher, Phys. Rev. B 72 (2005) 115417 (1-10) full pdf file
98.	The use of MIM tunnel junctions to investigate kinetic electron excitation in atomic collision cascades S. Meyer, D. Diesing, A. Wucher, Nucl. Instr. Meth. B 230, 608-612 full pdf file
97.	Molecular Depth-Profiling of Histamine in Ice using a Backmininster fullerence probe A. Wucher, S. Sun, C. Szakal, N. Winograd, Anal. Chem. 76 (2004) 7234-7242 full pdf file
96.	Self Sputtering Yields of Silver under Bombardment with polyatomic Projectiles A. Duvenbeck, M. Lindenblatt, A. Wucher, Nucl. Instr. Meth. B 228 (2005) 170-175 full pdf file
95.	Electronic Excitation in Atomic Collision Cascades A. Duvenbeck, Z. Sroubek, A. Wucher, Nucl. Instr. Meth. B 228 (2005) 325-329 full pdf file
94.	Depth-Profiling of Langmuir-Blodgett Films with a Buckminsterfullerene Probe A. G. Sostarecz, C. M. McQuaw, A. Wucher, N. Winograd, Anal. Chem. 76 (2004) 6651-6658 full pdf file
93.	Kinetic electron excitation in atomic collision cascades S. Meyer, D. Diesing, A. Wucher, Phys. Rev. Lett. 93 (2004) 137601 (1-4) full pdf file
92.	The Use of C60 Cluster Projectiles for Sputter Depth Profiling of Polycrystalline Metals S. Sun, C. Szakal, T. Roll, P. Mazarov, A. Wucher, N. Winograd, Surf. Interface Anal. 36 (2004) 1367-1372 full pdf file
91.	Cluster Formation at Metal Surfaces under Bombardment with SFm^+(m = 1,..,5) and Ar^+ Projectiles S. Ghalab, A. Wucher, Nucl. Instr. Meth. B 226 (2004) 264-273 full pdf file
90.	Computer simulation of low-energy electronic excitations in atomic collision cascades A. Duvenbeck, F. Sroubek, Z. Sroubek, A. Wucher, Nucl. Instr. Meth. B 225 (2004) 464-477 full pdf file
89.	C60 Molecular Depth Profiling of a Model Polymer C. Szakal, S. Sun, A. Wucher and N. Winograd, Appl. Surf. Sci. 231-232 (2004) 183-185 full pdf file
88.	Depth Profiling Studies of Multilayer Films with a C60^+ Ion Source A. Sostarecz, S. Sun, A. Wucher and N. Winograd, Appl. Surf. Sci. 231-232 (2004) 179-182 full pdf file
87.	Depth Profiling of Polycrystalline Multilayers using a Buckminsterfullerene Projectile S. Sun, A. Wucher, C. Szakal, N. Winograd, Appl. Phys. Lett. 84 (2004) 5177-5179 full pdf file
86.	Sputtering of Ag under C60^+ and Ga^+ Projectile Bombardment S. Sun, C. Szakal, E. J. Smiley, Z. Postawa, A. Wucher, B. J. Garrison, N. Winograd, Appl. Surf. Sci. 231-232 (2004) 64-67 full pdf file
85.	Sputtering of Indium Using Polyatomic Projectiles A. V. Samartsev, A. Wucher, Appl. Surf. Sci. 231/232 (2004) 191-195 full pdf file
84.	Molecular Depth Profiling in Ice Matrices Using C60 Projectiles A. Wucher, S. Sun, N. Winograd, Appl. Surf. Sci. 231/232 (2004) 68-71 full pdf file
83.	Molecule-specific imaging with mass spectrometry and a buckminsterfullerene probe: Application to characterizing solid-phase synthesized combinatorial libraries J. Y. Xu, C. W. Szakal, S. E. Martin, B. R. Peterson, A. Wucher; N. J. Winograd, J. Am. Chem. Soc. 126 (2004) 3902-3909 full pdf file
82.	Formation of excited Ag atoms in sputtering of silver Z. Sroubek, F. Sroubek, A. Wucher and Y. Yarmoff, Phys. Rev. B 68 (2003), 115426 (1-5) full pdf file
81.	Laser Desorption Imaging of Proteins from Ice via UV Femtosecond Laser Pulses J. I. Berry, S. Sun, Y. Dou, A. Wucher, N. Winograd, Anal. Chem. 75 (2003) 5146-5151 full pdf file
80.	Ionization Probability of  Atoms and Molecules sputtered from a Cesium covered Silver Surface S. Meyer, C. Staudt, A. Wucher, Appl. Surf. Sci. 203/204 (2003) 48-51 full pdf file
79.	Projectile Size Effects on Cluster Formation in Sputtering R. Heinrich and A. Wucher, Nucl. Instr. Meth. B 207 (2003), 136-144 full pdf file
78.	Formation of Sputtered Silver Clusters under Bombardment with SF5^+ Ions S. Ghalab, C. Staudt, S.E. Maksimov, P. Mazarov, V.I. Tugushev, N. Kh. Dzhemilev and A. Wucher, Nucl. Instr. Meth. B 197 (2002), 43-48 full pdf file
77.	Sputtering of Ag atoms into Metastable Excited States C. Staudt, A. Wucher, J. Bastiaansen, V. Philipsen, E. Vandeweert, P. Lievens, R.E. Silverans and Z. Sroubek, Phys. Rev. B 66 (2002), 085415 (1-12) full pdf file
76.	Generation of Large Indium Clusters by Sputtering C. Staudt and A. Wucher, Phys. Rev. B 66 (2002), 075419 (1-12) full pdf file
75.	Self Sputtering of Silver under Bombardment with Polyatomic Projectiles R. Heinrich and A. Wucher, Nucl. Instr. Meth. B 193 (2002), 781-786 full pdf file
74.	Internal Excitation of Sputtered Neutral Indium Clusters C. Staudt, A. Wucher, S. Neukermans, E. Janssens, F. Vanhoutte, E. Vandeweert R.E. Silverans and P. Lievens, Nucl. Instr. Meth. B 193 (2002), 787-793 full pdf file
73.	Laser Postionization: Fundamentals A. Wucher in ToF-SIMS: Surface Analysis by mass spectrometry, Ed. J. C. Vickerman, D. Briggs, IM Publications and Surface Spectra 2001, 347-374 full pdf file
72.	Formation of Clusters in Sputtering A. Wucher, Izvestja Academnii Nauk Ser.Fys. 66 (2002), 499-508 full pdf file
71.	Self-sputtering of silver by mono- and polyatomic projectiles: A molecular dynamics investigation M. Lindenblatt, R. Heinrich, A. Wucher and B. J. Garrison, J.Chem.Phys. 115 (2001), 8643-8654 full pdf file
70.	Formation of Sputtered Clusters: A Multistep Model N. Kh. Dzhemilev and A. Wucher, "Secondary Ion Mass Spectrometry SIMS XII" (Proceedings of 12th International Conference on Secondary Ion Mass Spectrometry, Louvain-la-Neuve, Belgium 1999), Ed. P. Bertrand, A. Benninghoven, H.W. Werner, Elsevier, Amsterdam 2000, p. 157-160 full pdf file
69.	Ionization Probability of Sputtered Clusters R. Heinrich, C. Staudt, M. Wahl and A. Wucher, "Secondary Ion Mass Spectrometry SIMS XII" (Proceedings of 12th International Conference on Secondary Ion Mass Spectrometry, Louvain-la-Neuve, Belgium 1999), Ed. P. Bertrand, A. Benninghoven, H.W. Werner, Elsevier, Amsterdam 2000, p. 111-114 full pdf file
68.	A Method for Quantitative Determination of Secondary Ion Formation Probabilities A. Wucher, R. Heinrich and C. Staudt, "Secondary Ion Mass Spectrometry SIMS XII" (Proceedings of 12th International Conference on Secondary Ion Mass Spectrometry, Louvain-la-Neuve, Belgium 1999), Ed. P. Bertrand, A. Benninghoven, H.W. Werner, Elsevier, Amsterdam 2000, p. 143-146  full pdf file
67.	Temperature Dependence of Sputtered Cluster Yields C. Staudt, R. Heinrich, P. Mazarov, A. Wucher, V.I. Tugushev and N. Kh. Dzhemilev, "Secondary Ion Mass Spectrometry SIMS XII" (Proceedings of 12th International Conference on Secondary Ion Mass Spectrometry, Louvain-la-Neuve, Belgium 1999), Ed. P. Bertrand, A. Benninghoven, H.W. Werner, Elsevier, Amsterdam 2000, p. 169-172 full pdf file
66.	Cluster Formation under Bombardment with Polyatomic Projectiles R. Heinrich and A. Wucher, Nucl. Inst. Meth. B 164-165 (2000), 720-726 full pdf file
65.	Formation of Large Clusters during Sputtering of Metal Surfaces C. Staudt, R. Heinrich and A. Wucher, Nucl. Instr. Meth. B 164-165 (2000), 677-686 full pdf file
64.	On the Temperature Dependence of sputtered Cluster Yields C. Staudt, R. Heinrich, P. Mazarov, A. Wucher, V. I. Tugushev, N. Kh. Dzhemilev, Nucl. Instr. Meth. B 164-165 (2000), 715-719 full pdf file
63.	Microanalysis with Secondary Ion and Secondary Neutral Mass Spectrometry H. Gnaser, H. Oechsner and A. Wucher in Surface Analysis of Glasses and Glass Ceramics – Science, Technology and Applications, ed. H. Bach, D. Krause (Springer Berlin, in preparation)
62.	Effects of oxygen dosing on Ca cluster yields and energy distributions C.S. Hansen, W.F. Calaway, M.J. Pelling. B.V. King, A. Wucher: Surf. Sci. 432 (1999), 199-210 full pdf file
61.	Detection of Large Neutral Clusters in Sputtering C. Staudt and A. Wucher, Proceedings of the International Conference on Resonance Ionization Spectroscopy RIS-98, UMIST, 1998, eds. J. Vickerman, J.E. Parks (AIP Press 1999), p. 217-222  full pdf file
60.	Sputtering of Atoms in Fine Structure States: A Probe of Excitation and De-excitation Events B.J. Garrison, N. Winograd, R. Chatterjee, Z. Postawa, A. Wucher, E. Vandeweert, P. Lievens, V. Philipsen and R.E. Silverans, Rapid Commun. Mass Spectrom. 12 (1998), 1266-1272 full pdf file
59.	VUV Single Photon versus Femtosecond Multiphoton Ionization of Sputtered Germanium Clusters A. Wucher, R. Heinrich, R.M. Braun, K.F. Willey and N. Winograd, Rapid Commun. Mass Spectrom. 12 (1998), 1241-1245 full pdf file
58.	Surface and Thin Film Analysis with Electron and Mass Spectrometric Techniques A. Wucher, Trends and New Applications of Thin Films (Proceedings of the 6^th International Symposium on Trends and Applications of Thin Films TATF, 17-20 March 1998 in Regensburg), Ed. H. Hoffmann (TransTech Publications 1998), p. 61-84 full pdf file
57.	Fragmentation lifetimes and the internal energy of sputtered clusters A. Wucher, N. Kh. Dzhemilev, I.V. Veryovkin and S.V. Verkhoturov, Nucl. Instr. Meth. B 149 (1998), 285-293 full pdf file
56.	Experiment and Simulation of cluster emission from 5 keV Ar --> Cu Th. J. Colla, H.M. Urbassek, A. Wucher, C. Staudt, R. Heinrich, B.J. Garrison, C. Dandachi and G. Betz, Nucl. Instr. Meth. B 143 (1998), 284-297 full pdf file
55.	Quantitation of Single Photon Ionization Laser SNMS M. Wulff, A. Wucher: "Secondary Ion Mass Spectrometry SIMS XI" (Proceedings of 11th International Conference on Secondary Ion Mass Spectrometry, Orlando, Florida 1997), Ed. G. Gillen, R. Lareau, J. Bennet and F. Stevie (Whiley, New York 1998), p. 665-668 full pdf file
54.	Formation of Sputtered Semiconductor Clusters R. Heinrich, A. Wucher: "Secondary Ion Mass Spectrometry SIMS XI" (Proceedings of 11th International Conference on Secondary Ion Mass Spectrometry, Orlando, Florida 1997), Ed. G. Gillen, R. Lareau, J. Bennet and F. Stevie (Whiley, New York 1998), p. 949-952 full pdf file
53.	Internal Energy of Sputtered Clusters: The Influence of Bombarding Conditions A. Wucher, A.D. Bekkerman, N. Kh. Dzhemilev, S.V. Verkhoturov, I.V. Veryovkin: Nucl. Instr. Meth. B 140 (1998), 311-318 full pdf file
52.	Yields and Energy Distributions of Sputtered Semiconductor Clusters R. Heinrich, A. Wucher: Nucl. Instr. Meth. B 140 (1998), 27-38 full pdf file
51.	Energy- and Angle-Dependent Excitation Probability of Sputtered Silver Atoms W. Berthold and A. Wucher: Phys. Rev. B 56 (1997), 4251-4260 full pdf file
50.	High Frequency Electron-Gas Secondary-Neutral-Mass Spectrometry: Evaluation of Transient Sputtering Effects R. Krimke, H. M. Urbassek, A. Wucher: J. Phys. D:Appl. Phys. 30 (1997), 1676-1682 full pdf file
49.	Metastable Excitation of Sputtered Silver Atoms A. Wucher and W. Berthold: Proceedings of the International Conference on Resonance Ionization Spectroscopy RIS-96, Penn State University, 1996, eds. N. Winograd, J.E. Parks (AIP Press 1997), p. 145-150 full pdf file
48.	Formation of Metastable Excited States during Sputtering of Transition Metals A. Wucher and Z. Sroubek: Phys. Rev. B 55 (1997), 780-786 full pdf file
47.	Cluster Formation in Sputtering: A Molecular Dynamics Study using the MD/MC-Corrected Effective Medium Potential A. Wucher and B.J. Garrison: J. Chem. Phys. 105, (1996), 5999-6007 full pdf file
46.	Depth Profiling of Tantalum Oxide Layers by Laser-SNMS A. Wucher, W. Berthold and M. Wahl: Proceedings of the European Conference on Surface and Interface Analysis, Montreux, 1995, p. 260 full pdf file
45.	Cluster Emission in Sputtering A.Wucher and M. Wahl: "Secondary Ion Mass Spectrometry SIMS X" (Proceedings of 10th International Conference on Secondary Ion Mass Spectrometry, Münster 1995), Ed. A. Benninghoven, B. Hagenhoff and H.W. Werner, Wiley 1997, p. 65-72 full pfd file
44.	Population of sputtered Metastable Silver Atoms W. Berthold and A. Wucher: Nucl. Instr. Meth. B 115 (1996), 411-414 full pdf file
43.	The Formation of Clusters during Ion Induced Sputtering of Metals A. Wucher and M. Wahl: Nucl. Instr. Meth. B 115 (1996), 581-589 full pdf file
42.	Electronic Excitation during Sputtering of Silver Atoms W. Berthold and A. Wucher: Phys. Rev. Lett. 76 (1996), 2181-2184 full pdf file
41.	Oberflächenanalytik mit dem Laser A. Wucher: Colloquia Academica (Akademie der Wissenschaften und der Literatur, Mainz), Franz Steiner Verlag Stuttgart 1995, p. 55 -91 full pdf file
40.	On the Role of Molecular Fragmentation during Depth Profiling of Tantalum Oxide Layers by Laser SNMS A. Wucher, K. Franzreb, H.J. Mathieu and D. Landolt: Surf. Interf. Anal. 23 (1995), 844-848 full pdf file
39.	Laterally Resolved Chemical Analysis of Solid Surfaces by Laser- SNMS W. Berthold and A. Wucher: Surf. Interf. Anal. 23 (1995), 393-398 full pdf file
38.	Relative Elemental Sensitivity Factors in Non-Resonant Laser-SNMS M. Wahl, D. Koch, W. Berthold and A. Wucher: Fres. J. Anal. Chem. 353 (1995), 354-359 full pdf file
37.	Rotational and vibrational excitation of sputtered silver dimers A. Wucher: Proceedings of the International Conference on Resonance Ionization Spectroscopy RIS-94, Bernkastel-Kues, Germany 1994, eds. H.-J. Kluge, J.E. Parks, K. Wendt (AIP Press 1995), p. 437-440 full pdf file
36.	VUV photoionization of sputtered neutral silver clusters  M. Wahl and A. Wucher: Nucl. Instr. Meth. B 94 (1994), 36-46 full pdf file
35.	Electron impact and single photon ionization cross sections of neutral silver clusters D. Koch, M. Wahl and A. Wucher: Z. Phys. D 32 (1994), 137-144 full pdf file
34.	The charge state of sputtered metal clusters A. Wucher, M. Wahl and H. Oechsner: SIMS IX (Proceedings of the SIMS 9 conference, Yokohama, Japan 1993),eds. A. Benninghoven, Y. Nihei, R. Shimizu, H.W. Werner, Whiley 1994, p.100-103 full pdf file
33.	Detection of sputtered metastable atoms by autoionization A. Wucher, W. Berthold, H. Oechsner and K. Franzreb: Phys. Rev. A 49 (1994), 2188-2190 full pdf file
32.	Yields of sputtered metal clusters: the influence of surface structure A. Wucher, Z. Ma, W.F. Calaway and M.J. Pellin: Surf. Sci. Lett. 304 (1994), L439-L444 full pdf file
31.	Internal energy of sputtered metal clusters A. Wucher: Phys. Rev. B 49 (1994), 2012-2020 full pdf file
30.	The mass distribution of sputtered metal clusters II. Model calculation A. Wucher: Nucl. Instr. Meth. B 83 (1993), 79-86 full pdf file
29.	The mass distribution of sputtered metal clusters I. Experiment A. Wucher, M. Wahl and H. Oechsner: Nucl. Instr. Meth. B 83 (1993), 73-78 full pdf file
28.	Sputtered Neutral Silver Clusters up to Ag18 A. Wucher, M. Wahl and H. Oechsner: Nucl. Instr. Meth. B 82 (1993), 337-346 full pdf file
27.	Ro-Vibrational population of sputtered metal dimers: The influence of unimolecular decomposition A. Wucher and B.J. Garrison: Nucl. Instr. Meth. B 82 (1993), 352-355 full pdf file
26.	Microanalysis of Solid Surfaces by Secondary Neutral Mass Spectrometry A. Wucher: Fres. J. Anal. Chem. 346 (1993), 3-10 full pdf file
25.	Characterization of the Fluxes of Neutral and Positively Charged Clusters Produced by Argon Ion Sputtering of Silver K. Franzreb, A. Wucher and H. Oechsner: Z. Phys. D 26 (1993), 101-103 full pdf file
24.	Formation of Neutral and Positively Charged Clusters during Sputtering of Silver K. Franzreb, A. Wucher and H. Oechsner: Surf. Sci. Lett. 279 (1992), L225-L230 full pdf file
23.	Unimolecular Decomposition in the Sputtering of Metal Clusters A. Wucher and B.J. Garrison: Phys. Rev. B 46 (1992) 4855-4864 full pdf file
22.	Energy Dependent Studies of Anisotropic Atomic Sputtering of Ni(111) A. Wucher, M. Watgen, C. Mößner, H. Oechsner and B.J. Garrison: Nucl. Instr. Meth. B67 (1992), 531-535 full pdf file
21.	Internal and Translational Energy of Sputtered Silver Dimers: A Molecular Dynamics Study A. Wucher and B.J. Garrison: Nucl. Instr. Meth. B67 (1992), 518-522 full pdf file
20.	Sputtering of Silver Dimers: A Molecular Dynamics Calculation Using a Many-Body Embedded-Atom Potential A. Wucher and B.J. Garrison: Surf. Sci 260 (1992), 257-266 full pdf file
19.	Formation of Secondary Cluster Ions during Sputtering of Silver and Copper K. Franzreb, A. Wucher and H. Oechsner: Phys. Rev. B 43 (1991), 14396-14399 full pdf file
18.	Saturation and Fragmentation in Non Resonant Laser Postionization of Sputtered Atoms and Molecules K. Franzreb, A. Wucher and H. Oechsner: Fres. J. Anal. Chem. 341 (1991), 7-11 full pdf file
17.	Absolute Cross Section for Electron Impact Ionization of Ag2 K. Franzreb, A. Wucher and H. Oechsner: Z. Phys. D19 (1991), 77-79 full pdf file
16.	Electron Impact Ionization of Small Silver and Copper Clusters K. Franzreb, A. Wucher and H. Oechsner: Z. Phys. D17 (1990), 51-56 full pdf file
15.	Absolute Depth Profiling of Thin Film Systems by Low Energy Secondary Neutral Mass Spectrometry A. Wucher, H. Oechsner and F. Novak: Thin Solid Films 174 (1989), 133-137 full pdf file
14.	Calibration of SNMS Depth Profile Analysis A. Wucher and H. Oechsner: "Plasma Surface Engineering", ed.E. Broszeit, W.D. Münz, H. Oechsner, K.-T. Rie, G.K. Wolf, DGM Informationsgesellschaft Verlag, Oberursel 1989, p. 737-738 full pdf file
13.	Depth Scale Calibration During Sputter Removal of Multilayer Systems by SNMS A. Wucher and H. Oechsner: Fresenius J. Anal. Chem. 333 (1989), 470-473 full pdf file
12.	Charakterisierung technischer Oberflächen für Anwendungen in der mittelständischen Industrie H. Oechsner, G. Bachmann, K.H. Müller and A. Wucher: VDI Technologiezentrum Physikalische Technologien, Statusseminar Dünnschichttechnologien Köln 1988, Tagungsband S. 4.1
11.	Emission Energy Dependence of Ionization Probabilities in Secondary Ion Emission from Oxygen covered Ta, Nb and Cu Surfaces A. Wucher and H. Oechsner: Surf. Sci.199 (1988), 567-578 full pdf file
10.	Energy dependent Ionization Probabilities for Atomic Secondary Ions A. Wucher and H. Oechsner: Secondary Ion Mass Spectrometry SIMS VI, ed. A. Benninghoven, A.M. Huber, H.W. Werner, Whiley & Sons, Chichester 1988, p. 143-146 full pdf file
09.	Quantitation of Molecular SNMS Signals M. Kopnarski, A. Wucher and H. Oechsner: Secondary Ion Mass Spectrometry SIMS VI, ed. A. Benninghoven, A.M. Huber, H.W. Werner, Whiley & Sons, Chichester 1988, p. 849-852 full pdf file
08.	Calculation of Post-Ionization Probabilities as a Function of Plasma Parameters in Electron Gas SNMS A. Wucher: J. Vac. Sci. Technol. A6 (1988), 2287-2292 full pdf file
07.	Angular Distributions of Particles Sputtered from Metals and Alloys A. Wucher and W. Reuter: J. Vac. Sci. Technol. A6 (1988), 2316-2318 full pdf file
06.	Plasma Studies on the Leybold-Heraeus INA 3 SNMS-System A. Wucher: J. Vac. Sci. Technol. A6 (1988), 2293-2298 full pdf file
05.	Relative Sensitivity Factors in Secondary Neutral Mass Spectrometry SNMS A. Wucher, F. Novak and W. Reuter: J. Vac. Sci. Technol. A6 (1988), 2265-2270 full pdf file
04.	Absolute Ionization probabilities in Secondary Ion Emission from Clean Metal Surfaces A. Wucher and H. Oechsner: Proc. of 21st Annual Conference of the Microbeam Analysis Society 1986, ed. A. D. Romig jr. and W. F. Chambers, San Francisco Press 1986, p. 79-81 full pdf file
03.	Energy Distributions of Metal Atoms and Monoxide Molecules Sputtered from Oxidized Ta and Nb A. Wucher and H. Oechsner: Nucl. Instr. Meth. B18 (1987), 458-463 full pdf file
02.	Quantitative Analysis of Thin Oxide and Nitride Layers on Tantalum by Sputtered Neutral Mass Spectrometry H. Oechsner and A. Wucher: Thin Solid Films 90 (1982), 327-328 full pdf file
01.	Quantitative Analysis of Thin Oxide Layers on Tantalum by Sputtered Neutral Mass Spectrometry (SNMS) H. Oechsner and A. Wucher: Applicat. Surf. Sci. 10 (1982), 342-348  full pdf file