WISSENSCHAFTLICHE VERÖFFENTLICHUNGEN

PROF. DR. A. WUCHER

 

173

Strong field ionization and imaging of C60 sputtered molecules: overcoming matrix effects and improving sensitivity

 Kucher, A., Jackson L.M., Lerach, J.O.,Bloom A.N., Popczun N.J., Wucher, A., Winograd, N., Anal. Chem., 86 17 (2014) 8613-8620

full pdf file

 

172

Strong field photoionization of ß-estradiol between 1200 nm and 2000 nm: Strategies to optimize molecular post-ionization in Secondary Neutral Mass Spectrometry

 Kucher, A., Wucher, A., Winograd, N., Anal. Chem., submitted (2014)

 

171

Formation of neutral InnCm clusters under C60 ion bombardment of indium

Breuer, L., Kucher, A., Herder, M., Wucher, A., Winograd N. J. Phys. Chem. A submitted (2014)

 

170

A microscopic view of secondary ion formation

Wucher, A., Weidtmann, B., Duvenbeck, A., Nucl Instrum Meth B 303-0 (2013) 108-111

full pdf file

 

 

169

Three-Dimensional Imaging with Cluster Ion Beams

Wucher, A., Fisher, G. L., Mahoney, C. M., ., in: Cluster Secondary Ion Mass Spectrometry, Ed. Mahoney, C. M , Wiley (2013) 207-246

full pdf file

 

 

168

Molecular Depth Profiling with Cluster Ion Beams

Mahoney, C. M., Wucher, A., in: Cluster Secondary Ion Mass Spectrometry, Ed. Mahoney, C. M , Wiley (2013)  117-205 full pdf file

 

 

167

Laser postionization - fundamentals

Wucher, A., in: TOF-SIMS: Materials analysis by mass spectrometry (IM Publications and SurfaceSpectra) ed. Vickerman, J.C.; Briggs, D. 8-2 (2013) 217-246

 

 

166

Computer simulation of cluster impact induced electronic excitation of solids

Weidtmann, B., Hanke, S., Duvenbeck, A., Wucher, A., Nucl Instrum Meth B 303-0 (2013) 51-54  full pdf file

 

 

165

Molecular depth profiling

Shard, A.G., Gilmore, I. S., Wucher, A., in: TOF-SIMS: Materials analysis by mass spectrometry (IM Publications and SurfaceSpectra), Ed. J. Vickerman, 12 (2013) 311-334

full pdf file

 

164.

Computer simulation of internal electron emission in ion-bombarded metals

Hanke, S.; Duvenbeck, A.; Heuser, C.; Weidtmann, B.; Diesing, D.; Marpe, M.; Wucher, A. . Nucl Instrum Meth B 303-0 (2013) 55-58  full pdf file

 

 

163

An experimental and theoretical view of energetic C-60 cluster bombardment onto molecular solids

Brenes, D. A.; Postawa, Z.; Wucher, A.; Blenkinsopp, P.; Garrison, B. J.; Winograd, N. Surf. Interface Anal; 45-1 (2013) 50-53

full pdf file

 

162.

A statistical interpretation of molecular delta layer depth profiles

Wucher,A., Krantzman,K.D., Lu,C., Winograd,N., Surf. Interface Anal (2012) full pdf file

 

161.

A statistical approach to delta layer depth profiling

Wucher A., Krantzman,K.D., Surf. Interface Anal., 44-9 (2012) 1243-1248 full pdf file

 

160

The role of electron temperature dynamics for secondary ion formation

Weidtmann,B., Hanke,S., Duvenbeck,A., Wucher,A. Surf. Interface Anal. (2012) full pdf file

 

159.

Ionization probabilities of sputtered indium atoms under atomic and polyatomic Aum- ion bombardment

Samartsev,A.V. Heuser,C. Wucher,A., Interface Anal. 45 (2012) 87-89 full pdf file

 

 

158

Steady-State Statistical Sputtering Model for Extracting Depth Profiles from Molecular Dynamics Simulations of Dynamic SIMS

Paruch, R. J., Postawa, Z., Wucher, A., Garrison, B. J., J. Phys. Chem. C 116-1 (2012) 1042-1051 full pdf file

 

157

Cluster Secondary Ion Mass Spectrometry and the Temperature Dependence of Molecular Depth Profiles

Mao,D., Wucher,A., Brenes,D.A., Lu,C., Winograd,N. Anal Chem. (2012) full pdf file

 

 

156

Temperature effects of sputtering of Langmuir–Blodgett multilayers

Mao D, Brenes D, A., Lu C., Wucher A., Winograd, N., Surf. Interface Anal. (2012)

full pdf file

 

 

154.

Investigations of molecular depth profiling with dual beam sputtering

Lu, C., Wucher, A., Winograd, N., Surf. Interface Anal. (2012)

full pdf file

154

Ionization probabilities of sputtered indium atoms under atomic and polyatomic Aum- ion bombardment

Samartev, A: V., Heuser, C., Wucher, A., Surf. Interface Anal. (2012)

full pdf file

153.

Temperature effects in the sputtering of a molecular solid by energetic atomic and cluster projectiles

Brenes, D, A.,Willingham D, Winograd, N, Wucher, A, Surf. Interface Anal. (2011), 43, 78–80 full pdf file

 

 

152.

Fluid Flow and Effusive Desorption: Dominant Mechanisms of Energy Dissipation after Energetic Cluster Bombardment of Molecular Solids

Brenes, D., A., Garrison, B., J., Winograd, N., Postawa, Z.,  Wucher, A.,Blenkinsopp, P., J. Phys. Chem. Lett. (2011), 2, 2009–2014

full pdf file

 

 

151.

Molecular Depth Profiling of Buried Lipid Bilayers Using C60-Secondary Ion Mass Spectrometry

Lu, C., Wucher, A., Winograd, N., Anal Chem. 83 1 (2011) 351-358 full pdf file

 

 

150.

Ionization effects in molecular depth profiling of trehalose films using buckminsterfullerene (C60) cluster ions

Lu, C., Wucher, A., Winograd, N., Surf. Interface Anal. . 43 1-2 (2011) 99 full pdf file

 

 

149.

Fundamental studies of molecular depth profiling using organic delta layers as model systems

Lu, C., Wucher, A., Winograd, N., Surf. Interface Anal. . 43 1-2 (2011) 81 full pdf file

 

148.

Molecular depth profiling by wedged crater beveling

Mao, D., Lu, C., Winograd, N., Wucher, A., Anal Chem, 83 (2011) 6410 -6417 full pdf file

 

147.

Internal electron emission in metal-insulator-metal thin film tunnel devices bombarded with keV argon and gold-cluster projectiles

Marpe, M., Heuser, C., Diesing, D., Wucher, A., ., Nuclear Instruments & Methods in Physics Research B.,269 (2011), 972 – 976

full pdf file

 

146.

Steady-state statistical sputtering model for extracting depth profiles from molecular dynamics simulations of dynamic SIMS

Paruch, R, Postawa, Z, Wucher, A, Garrison, B. J., Journal of Physical Chemistry (2011) full pdf file

 

145.

Depth Profiling of Anodic Tantalum Oxide Films with Gold Cluster Ions

Poerschke, D, Wucher, A, Surf. Interface Anal. 43 1-2 (2011) 171-174

full pdf file

 

144.

Influence of the polar angle of incidence on secondary ion formation in self-sputtering of silver

Weidtmann, B, Hanke, S, Duvenbeck, A, Wucher, A, Surf. Interface Anal. 43 1-2 (2011) 24 full pdf file

143.

Investigating the fundamentals of molecular depth profiling using strong-field photoionization of sputtered neutrals, Willingham D, Surf. Interf. Anal 43 (2011), 45 – 48 full pdf file

 

 

142.

 A statistical model describing delta layer sputter depth profiles

Wucher, A. , Kranztman, KD, Surface and Interface Analysis (2012) full pdf file

 

 

141.

Retrospective sputter depth profiling using 3D mass spectral imaging techniques

Zheng,L., Wucher,A.; Winograd N., Applied Surface Science (2011), 41 full pdf file

 

 

140.

Predicting Kinetic Electron Emission in MD-Simulations of Atomic Collision Cascades

Duvenbeck,A; Wucher,A. Physical Review B, (2010), 5715-5720 full pdf file

 

 

139.

Fluence Effects in C60 bombardment of Silicon

Krantzman,K.D.; Wucher,A., Journal of Physical Chemistry C, (2010), 5480-5490 full pdf file

 

 

138.

Influence of the polar angle of incidence on secondary ion formation in self-sputtering silver

Weidtmann,B.; Hanke,S.; Duvenbeck,A; Wucher,A., Surface and Interface Analysis, full pdf file

 

 

137.

Strong field photoionization of neutrals and the fundamentals of molecular depth profiling

Willingham,D.; Wucher,A.; Winograd,N., Journal of Chemical Physics, (2010), 5391-5399 full pdf file

 

 

136.

Kinetic excitation of solids induced by energetic particle bombardment: Influence of impact angle

Heuser,C.; Marpe,M.; Diesing,D.; Wucher,A., Nuclear Instruments & Methods in Physics Research B., (2009), 601-604

full pdf file

 

 

135.

The influence of projectile charge state on ionization probabilities of sputtered atoms

Meyer,S.; Wucher,A. Nuclear Instruments & Methods in Physics Research B, (2009), 646, 648 full pdf file

 

 

134.

HICS: Highly charged ion collisions with surfaces

Peters,T.; Haake,C.; Hopster,J.; Sokolovsky,V.; Wucher,A.; Schleberger,M. Nuclear Instruments & Methods in Physics Research B, (2009), 687-690 full pdf file

 

 

133.

Crystallographic effects in the kinetic excitation of metal surfaces: A computational study

Weidtmann,B.; Duvenbeck,A.; Hanke,S.; Wucher,A., Nuclear Instruments & Methods in Physics Research B, (2009), 598-600 full pdf file

 

 

132.

Molecular sputter depth profiling using carbon cluster beams

Wucher,A.; Winograd,N., (2010), Analytical and Bioanalytical Chemistry, 105-114 full pdf file

 

 

131.

Retrospective sputter depth profiling using 3D mass spectral imaging techniques

Zheng,L.; Wucher,A.; Winograd,N., (2011), Surface and Interface Analysis 43, 41-44 full pdf file

 

 

130.

Predicting Secondary Ion Formation in Molecular Dynamics Simulations of Sputtering

Weidtmann,B.; Duvenbeck,A; Wucher,A., (2008), Applied Surface Science 813-815 full pdf file

 

 

129.

Three-dimensional Molecular Imaging using Mass Spectrometry and Atomic Force Microscopy

Wucher,A.; Cheng,J.; Zheng,L.; Willingham,D.; Winograd,N.,(2008), Applied Surface Science, 984-986 full pdf file

 

 

128.

On the internal energy of sputtered clusters
A. Wucher, C. Staudt, S. Neukermans, E. Janssens, F. Vanhoutte, R.E. Silverans, P. Lievens, New J. Phys.10 (2008), 103007-103007-22 full pdf file

 

 

127.

Molecular Depth Profiling using a C60 Cluster Beam: the Role of Impact Energy
A. Wucher, J. Cheng and N. Winograd, Anal. Chem. 112 2008, 16550-16555 full pdf file

 

 

126.

A simple erosion dynamics model of molecular sputter depth profiling
A. Wucher, Surf. Interf. Anal.40 (2008), 1545-1551 full pdf file

 

 

125.

Kinetic electron excitation of solids induced by fast particle bombardment
S. Meyer, C. Heuser, D. Diesing and A. Wucher, Phys. Rev. B 78 (2008), 035428 (1-13) full pdf file

 

 

124.

Molecular depth profiling of trehalose using a C60 cluster ion beam
A. Wucher, J. Cheng and N. Winograd, Appl. Surf. Sci. 255 (2008), 959-961 full pdf file

 

 

123.

Fundamental Studies of Molecular Depth Profiling and 3-D Imaging using Langmuir-Blodgett Films as a Model
L. Zheng, A. Wucher and N. Winograd, Appl. Surf. Sci. 255 (2008), 816-818 full pdf file

 

 

122.

Depth resolution during C60+  profiling of multilayer molecular films
L. Zheng, A. Wucher and N. Winograd, Anal. Chem. 80 (2008), 7363-7371 full pdf file

 

 

121.

Modeling hot electron generation induced by electron promotion in atomic-collision cascades in metals
A. Duvenbeck, B. Weidtmann, O. Weingart and A. Wucher, Phys. Rev. B 77 (2008) 245444 (1-7) full pdf file

 

 

120.

Hot electrons induced by  cold multiply charged ions
T. Peters, C. Haake, D. Diesing, D. Kovacs, A. Golczewski, G. Kowarik, F. Aumayr, A. Wucher and M. Schleberger, New J. Phys. 10 (2008), 073019 (1-8) full pdf file

 

 

119.

Formation of atomic secondary ions in sputtering
A. Wucher, Appl. Surf. Sci. 255 (2008), 1194-1200 full pdf file

 

 

118.

Predicting secondary ion formation in molecular dynamics simulations of sputtering
B. Weidtmann, A. Duvenbeck and A. Wucher, Appl. Surf. Sci 255 (2008), 813-815 full pdf file

 

 

117.

Energy Deposition during Molecular Depth Profiling Experiments with Cluster Ion Beams
J. Kozole, A. Wucher and N. Winograd, Anal. Chem. 80 (2008), 5293-5301 full pdf file

116.

Potential electron emission induced by multiply charged ions in thin film junnel junctions
D. A. Kovacs, T. Peters, C. Haake, M.Schleberger, A. Wucher, A. Golczewski, F. Aumayr, D. Diesing, Phys. Rev. B 77 (2008) 77 245432 (1-11)
full pdf file

 

 

115.

Photo and particle induced transport of excited carriers in thin film tunnel junctions
D. A. Kovacs, J. Winter, S. Meyer, A. Wucher and D. Diesing, Phys. Rev. B 76(2007) 235408 (1-12)
full pdf file

 

 

114.

Protocols for Three-Dimensional Molecular Imaging using Mass Spectrometry
A. Wucher, J. Cheng and N. Winograd, Anal. Chem. 79 (2007) 5529-5539
full pdf file

 

 

113.

The role of electronic friction of low-energy recoils in atomic collision cascades
A. Duvenbeck, O. Weingart, V. Buss, A. Wucher, Nucl. Instr. Meth. B. 258 (2007) 83-86 full pdf file

 

 

112.

Electron promotion and electronic friction in atomic collision cascades
A. Duvenbeck, O. Weingart, V. Buss, A. Wucher, New J. Phys. 9 (2007) 38 (1-19) full pdf file

 

 

111.

On the role of electronic friction and electron promotion in kinetic excitation of solids
A. Duvenbeck, O. Weingart, V. Buss, A. Wucher, Nucl. Instr. Meth. B. 255 (2007) 281-285 full pdf file

 

 

110.

Sputtering: Experiment
A. Wucher, K. Dan. Vidensk. Selsk, Mat. Fys. Medd. 52 (2007) 405-432 full pdf file

 

 

109.

Kinetic excitation of solids: The concept of electronic friction
M. Lindenblatt, E. Pehlke, A. Duvenbeck, B. Rethfeld, A. Wucher, Nucl. Instr. Meth. B. 246 (2006) 333-339
full pdf file

 

 

108.

Molecular secondary ion formation under cluster bombardment: A fundamental review
A. Wucher, Appl. Surf. Sci. 252 (2006) 6482-6489
full pdf file

 

 

107.

Kinetic energy distributions of neutral In and In2 sputtered by polyatomic ion bombardment
A.V. Samartsev and A. Wucher, Appl. Surf. Sci. 252 (2006) 6470-6473
full pdf file

 

 

106.

Chemically alternating Langmuir-Blodgett thin films as a model for molecular depth profiling by mass spectrometry
J. Zheng, A. Wucher and N. Winograd, J. Am. Soc. Mass. Spectrom. 19 (2007) 96-102
full pdf file

 

 

105.

Molecular Depth Profiling with Cluster Ion Beams
J. Cheng, A. Wucher and N. Winograd, J. Phys. Chem. B. 110 (2006) 8329-8336
full pdf file

 

 

104.

Yields and ionization probabilities of sputtered Inn particles under atomic and polyatomic Aum ion bombardment
A.V. Samartsev and A. Wucher Appl. Surf. Sci. 252 (2006) 6474-6477 full pdf file

 

 

103.

Determination of energy dependent ionization probabilities for sputtered particles
P. Mazarov, A.V. Samartsev and A. Wucher, Appl. Surf. Sci. (2006) 6452-6455 full pdf file

 

 

102.

Low energy electronic excitation in atomic collision cascades: a nonlinear transport   model
A. Duvenbeck and A. Wucher, Phys. Rev. B 72 (2005) 165408 (1-9)
full pdf file, suppl. material

 

 

101.

Energetic Ion Bombardment of Ag Surfaces by C+60 and Ga+ Projectiles 
S. Sun, C. Szakal, A. Wucher and N. Winograd, J. Am. Soc. Mass. Spectrom. 16 (2005) 1677-1686
full pdf file

 

 

100.

Laser post-ionization secondary neutral mass spectrometry for ultra-trace analysis of samples from space return missions
I.V. Veryovkin, W.F. Calaway, C.E Tripa, J.F. Moore, A. Wucher, M.J. Pellin, Nucl. Instrum. Methods B 241 (2005) 356-360 full pdf file

 

 

99.

Sputtering of Indium using Aum Projectiles: Transition from Linear Cascade to Spike Regime
A.V. Samartsev, A. Duvenbeck and A. Wucher, Phys. Rev. B 72 (2005) 115417 (1-10) full pdf file

 

 

98.

The use of MIM tunnel junctions to investigate kinetic electron excitation in atomic collision cascades
S. Meyer, D. Diesing, A. Wucher, Nucl. Instr. Meth. B 230, 608-612 full pdf file

 

 

97.

Molecular Depth-Profiling of Histamine in Ice using a Backmininster fullerence probe
A. Wucher, S. Sun, C. Szakal, N. Winograd, Anal. Chem. 76 (2004) 7234-7242 full pdf file

 

 

96.

Self Sputtering Yields of Silver under Bombardment with polyatomic Projectiles
A. Duvenbeck, M. Lindenblatt, A. Wucher, Nucl. Instr. Meth. B 228 (2005) 170-175 full pdf file

 

 

95.

Electronic Excitation in Atomic Collision Cascades
A. Duvenbeck, Z. Sroubek, A. Wucher, Nucl. Instr. Meth. B 228 (2005) 325-329 full pdf file

 

 

94.

Depth-Profiling of Langmuir-Blodgett Films with a Buckminsterfullerene Probe
A. G. Sostarecz, C. M. McQuaw, A. Wucher, N. Winograd, Anal. Chem. 76 (2004) 6651-6658 full pdf file

 

 

93.

Kinetic electron excitation in atomic collision cascades
S. Meyer, D. Diesing, A. Wucher, Phys. Rev. Lett. 93 (2004) 137601 (1-4) full pdf file

 

 

92.

The Use of C60 Cluster Projectiles for Sputter Depth Profiling of Polycrystalline Metals
S. Sun, C. Szakal, T. Roll, P. Mazarov, A. Wucher, N. Winograd, Surf. Interface Anal. 36 (2004) 1367-1372
full pdf file

 

 

91.

Cluster Formation at Metal Surfaces under Bombardment with SFm+(m = 1,..,5) and Ar+ Projectiles
S. Ghalab, A. Wucher, Nucl. Instr. Meth. B 226 (2004) 264-273 full pdf file

 

 

90.

Computer simulation of low-energy electronic excitations in atomic collision cascades
A. Duvenbeck, F. Sroubek, Z. Sroubek, A. Wucher, Nucl. Instr. Meth. B 225 (2004) 464-477 full pdf file

 

 

89.

C60 Molecular Depth Profiling of a Model Polymer
C. Szakal, S. Sun, A. Wucher and N. Winograd, Appl. Surf. Sci. 231-232 (2004) 183-185
full pdf file

 

 

88.

Depth Profiling Studies of Multilayer Films with a C60+ Ion Source
A. Sostarecz, S. Sun, A. Wucher and N. Winograd, Appl. Surf. Sci. 231-232 (2004) 179-182
full pdf file

 

 

87.

Depth Profiling of Polycrystalline Multilayers using a Buckminsterfullerene Projectile
S. Sun, A. Wucher, C. Szakal, N. Winograd, Appl. Phys. Lett. 84 (2004) 5177-5179
full pdf file

 

 

86.

Sputtering of Ag under C60+ and Ga+ Projectile Bombardment
S. Sun, C. Szakal, E. J. Smiley, Z. Postawa, A. Wucher, B. J. Garrison, N. Winograd, Appl. Surf. Sci. 231-232 (2004) 64-67
full pdf file

 

 

85.

Sputtering of Indium Using Polyatomic Projectiles
A. V. Samartsev, A. Wucher, Appl. Surf. Sci. 231/232 (2004) 191-195
full pdf file

 

 

84.

Molecular Depth Profiling in Ice Matrices Using C60 Projectiles
A. Wucher, S. Sun, N. Winograd, Appl. Surf. Sci. 231/232 (2004) 68-71
full pdf file

 

 

83.

Molecule-specific imaging with mass spectrometry and a buckminsterfullerene probe: Application to characterizing solid-phase synthesized combinatorial libraries
J. Y. Xu, C. W. Szakal, S. E. Martin, B. R. Peterson, A. Wucher; N. J. Winograd, J. Am. Chem. Soc. 126 (2004) 3902-3909
full pdf file

 

 

82.

Formation of excited Ag atoms in sputtering of silver
Z. Sroubek, F. Sroubek, A. Wucher and Y. Yarmoff, Phys. Rev. B 68 (2003), 115426 (1-5)
full pdf file

 

 

81.

Laser Desorption Imaging of Proteins from Ice via UV Femtosecond Laser Pulses
J. I. Berry, S. Sun, Y. Dou, A. Wucher, N. Winograd, Anal. Chem. 75 (2003) 5146-5151
full pdf file

 

 

80.

Ionization Probability of  Atoms and Molecules sputtered from a Cesium covered Silver Surface
S. Meyer, C. Staudt, A. Wucher, Appl. Surf. Sci. 203/204 (2003) 48-51
full pdf file

 

 

79.

Projectile Size Effects on Cluster Formation in Sputtering
R. Heinrich and A. Wucher, Nucl. Instr. Meth. B 207 (2003), 136-144
full pdf file

 

 

78.

Formation of Sputtered Silver Clusters under Bombardment with SF5+ Ions
S. Ghalab, C. Staudt, S.E. Maksimov, P. Mazarov, V.I. Tugushev, N. Kh. Dzhemilev and A. Wucher, Nucl. Instr. Meth. B 197 (2002), 43-48
full pdf file

 

 

77.

Sputtering of Ag atoms into Metastable Excited States
C. Staudt, A. Wucher, J. Bastiaansen, V. Philipsen, E. Vandeweert, P. Lievens, R.E. Silverans and Z. Sroubek, Phys. Rev. B 66 (2002), 085415 (1-12)
full pdf file

 

 

76.

Generation of Large Indium Clusters by Sputtering
C. Staudt and A. Wucher, Phys. Rev. B 66 (2002), 075419 (1-12)
full pdf file

 

 

75.

Self Sputtering of Silver under Bombardment with Polyatomic Projectiles
R. Heinrich and A. Wucher, Nucl. Instr. Meth. B 193 (2002), 781-786
full pdf file

 

 

74.

Internal Excitation of Sputtered Neutral Indium Clusters
C. Staudt, A. Wucher, S. Neukermans, E. Janssens, F. Vanhoutte, E. Vandeweert R.E. Silverans and P. Lievens, Nucl. Instr. Meth. B 193 (2002), 787-793
full pdf file

 

 

73.

Laser Postionization: Fundamentals
A. Wucher in ToF-SIMS: Surface Analysis by mass spectrometry, Ed. J. C. Vickerman, D. Briggs, IM Publications and Surface Spectra 2001, 347-374

 

 

72.

Formation of Clusters in Sputtering
A. Wucher, Izvestja Academnii Nauk Ser.Fys. 66 (2002), 499-508
full pdf file

 

 

71.

Self-sputtering of silver by mono- and polyatomic projectiles: A molecular dynamics investigation
M. Lindenblatt, R. Heinrich, A. Wucher and B. J. Garrison, J.Chem.Phys. 115 (2001), 8643-8654
full pdf file

 

 

70.

Formation of Sputtered Clusters: A Multistep Model
N. Kh. Dzhemilev and A. Wucher, "Secondary Ion Mass Spectrometry SIMS XII" (Proceedings of 12th International Conference on Secondary Ion Mass Spectrometry, Louvain-la-Neuve, Belgium 1999), Ed. P. Bertrand, A. Benninghoven, H.W. Werner, Elsevier, Amsterdam 2000, p. 157-160
full pdf file

 

 

69.

Ionization Probability of Sputtered Clusters
R. Heinrich, C. Staudt, M. Wahl and A. Wucher, "Secondary Ion Mass Spectrometry SIMS XII" (Proceedings of 12th International Conference on Secondary Ion Mass Spectrometry, Louvain-la-Neuve, Belgium 1999), Ed. P. Bertrand, A. Benninghoven, H.W. Werner, Elsevier, Amsterdam 2000, p. 111-114
full pdf file

 

 

68.

A Method for Quantitative Determination of Secondary Ion Formation Probabilities
A. Wucher, R. Heinrich and C. Staudt, "Secondary Ion Mass Spectrometry SIMS XII" (Proceedings of 12th International Conference on Secondary Ion Mass Spectrometry, Louvain-la-Neuve, Belgium 1999), Ed. P. Bertrand, A. Benninghoven, H.W. Werner, Elsevier, Amsterdam 2000, p. 143-146 
full pdf file

 

 

67.

Temperature Dependence of Sputtered Cluster Yields
C. Staudt, R. Heinrich, P. Mazarov, A. Wucher, V.I. Tugushev and N. Kh. Dzhemilev, "Secondary Ion Mass Spectrometry SIMS XII" (Proceedings of 12th International Conference on Secondary Ion Mass Spectrometry, Louvain-la-Neuve, Belgium 1999), Ed. P. Bertrand, A. Benninghoven, H.W. Werner, Elsevier, Amsterdam 2000, p. 169-172
full pdf file

 

 

66.

Cluster Formation under Bombardment with Polyatomic Projectiles
R. Heinrich and A. Wucher, Nucl. Inst. Meth. B 164-165 (2000), 720-726
full pdf file

 

 

65.

Formation of Large Clusters during Sputtering of Metal Surfaces
C. Staudt, R. Heinrich and A. Wucher, Nucl. Instr. Meth. B 164-165 (2000), 677-686
full pdf file

 

 

64.

On the Temperature Dependence of sputtered Cluster Yields
C. Staudt, R. Heinrich, P. Mazarov, A. Wucher, V. I. Tugushev, N. Kh. Dzhemilev, Nucl. Instr. Meth. B 164-165 (2000), 715-719
full pdf file

 

 

63.

Microanalysis with Secondary Ion and Secondary Neutral Mass Spectrometry
H. Gnaser, H. Oechsner and A. Wucher in Surface Analysis of Glasses and Glass Ceramics – Science, Technology and Applications, ed.
H. Bach, D. Krause (Springer Berlin, in preparation)

 

 

62.

Effects of oxygen dosing on Ca cluster yields and energy distributions
C.S. Hansen, W.F. Calaway, M.J. Pelling. B.V. King, A.
Wucher: Surf. Sci. 432 (1999), 199-210 full pdf file

 

 

61.

Detection of Large Neutral Clusters in Sputtering
C. Staudt and A. Wucher, Proceedings of the International Conference on Resonance Ionization Spectroscopy RIS-98, UMIST, 1998, eds. J. Vickerman, J.E. Parks (AIP Press 1999), p. 217-222 
full pdf file

 

 

60.

Sputtering of Atoms in Fine Structure States: A Probe of Excitation and De-excitation Events
B.J. Garrison, N. Winograd, R. Chatterjee, Z. Postawa, A. Wucher, E. Vandeweert, P. Lievens, V. Philipsen and R.E. Silverans, Rapid Commun. Mass Spectrom. 12 (1998), 1266-1272
full pdf file

 

 

59.

VUV Single Photon versus Femtosecond Multiphoton Ionization of Sputtered Germanium Clusters
A. Wucher, R. Heinrich, R.M. Braun, K.F. Willey and N. Winograd, Rapid Commun. Mass Spectrom. 12 (1998), 1241-1245
full pdf file

 

 

58.

Surface and Thin Film Analysis with Electron and Mass Spectrometric Techniques
A. Wucher, Trends and New Applications of Thin Films (Proceedings of the 6th International Symposium on Trends and Applications of Thin Films TATF
, 17-20 March 1998 in Regensburg), Ed. H. Hoffmann (TransTech Publications 1998), p. 61-84 full pdf file

 

 

57.

Fragmentation lifetimes and the internal energy of sputtered clusters
A. Wucher, N. Kh. Dzhemilev, I.V. Veryovkin and S.V. Verkhoturov, Nucl. Instr. Meth. B 149 (1998), 285-293
full pdf file

 

 

56.

Experiment and Simulation of cluster emission from 5 keV Ar --> Cu
Th. J. Colla, H.M. Urbassek, A. Wucher, C. Staudt, R. Heinrich, B.J. Garrison, C. Dandachi and G. Betz, Nucl. Instr. Meth. B 143 (1998), 284-297
full pdf file

 

 

55.

Quantitation of Single Photon Ionization Laser SNMS
M. Wulff, A. Wucher: "Secondary Ion Mass Spectrometry SIMS XI" (Proceedings of 11th International Conference on Secondary Ion Mass Spectrometry, Orlando, Florida 1997), Ed. G. Gillen, R. Lareau, J. Bennet and F. Stevie (Whiley, New York 1998), p. 665-668
full pdf file

 

 

54.

Formation of Sputtered Semiconductor Clusters
R. Heinrich, A. Wucher: "Secondary Ion Mass Spectrometry SIMS XI" (Proceedings of 11th International Conference on Secondary Ion Mass Spectrometry, Orlando, Florida 1997), Ed. G. Gillen, R. Lareau, J. Bennet and F. Stevie (Whiley, New York 1998), p. 949-952
full pdf file

 

 

53.

Internal Energy of Sputtered Clusters: The Influence of Bombarding Conditions
A. Wucher, A.D. Bekkerman, N. Kh. Dzhemilev, S.V. Verkhoturov, I.V. Veryovkin: Nucl. Instr. Meth. B 140 (1998), 311-318
full pdf file

 

 

52.

Yields and Energy Distributions of Sputtered Semiconductor Clusters
R. Heinrich, A. Wucher: Nucl. Instr. Meth. B 140 (1998), 27-38
full pdf file

 

 

51.

Energy- and Angle-Dependent Excitation Probability of Sputtered Silver Atoms
W. Berthold and A. Wucher: Phys. Rev. B 56 (1997), 4251-4260
full pdf file

 

 

50.

High Frequency Electron-Gas Secondary-Neutral-Mass Spectrometry: Evaluation of Transient Sputtering Effects
R. Krimke, H. M. Urbassek, A. Wucher: J. Phys. D:Appl. Phys. 30 (1997), 1676-1682
full pdf file

 

 

49.

Metastable Excitation of Sputtered Silver Atoms
A. Wucher and W. Berthold: Proceedings of the International Conference on Resonance Ionization Spectroscopy RIS-96, Penn State University, 1996, eds.
N. Winograd, J.E. Parks (AIP Press 1997), p. 145-150 full pdf file

 

 

48.

Formation of Metastable Excited States during Sputtering of Transition Metals
A. Wucher and Z. Sroubek: Phys. Rev. B 55 (1997), 780-786
full pdf file

 

 

47.

Cluster Formation in Sputtering: A Molecular Dynamics Study using the MD/MC-Corrected Effective Medium Potential
A. Wucher and B.J. Garrison: J. Chem. Phys. 105, (1996), 5999-6007
full pdf file

 

 

46.

Depth Profiling of Tantalum Oxide Layers by Laser-SNMS
A. Wucher, W. Berthold and M. Wahl: Proceedings of the European Conference on Surface and Interface Analysis, Montreux, 1995, p. 260
full pdf file

 

 

45.

Cluster Emission in Sputtering
A.Wucher and M. Wahl: "Secondary Ion Mass Spectrometry SIMS X" (Proceedings of 10th International Conference on Secondary Ion Mass Spectrometry, Münster 1995), Ed. A. Benninghoven, B. Hagenhoff and H.W. Werner, Wiley 1997, p. 65-72
full pfd file

 

 

44.

Population of sputtered Metastable Silver Atoms
W. Berthold and A. Wucher: Nucl. Instr. Meth. B 115 (1996), 411-414
full pdf file

 

 

43.

The Formation of Clusters during Ion Induced Sputtering of Metals
A. Wucher and M. Wahl: Nucl. Instr. Meth. B 115 (1996), 581-589
full pdf file

 

 

42.

Electronic Excitation during Sputtering of Silver Atoms
W. Berthold and A. Wucher: Phys. Rev. Lett. 76 (1996), 2181-2184 full pdf file

 

 

41.

Oberflächenanalytik mit dem Laser
A. Wucher: Colloquia Academica (Akademie der Wissenschaften und der Literatur, Mainz), Franz Steiner Verlag Stuttgart 1995, p. 55 -91 full pdf file

 

 

40.

On the Role of Molecular Fragmentation during Depth Profiling of Tantalum Oxide Layers by Laser SNMS
A. Wucher, K. Franzreb, H.J. Mathieu and D. Landolt: Surf. Interf. Anal. 23 (1995), 844-848 full pdf file

 

 

39.

Laterally Resolved Chemical Analysis of Solid Surfaces by Laser- SNMS
W. Berthold and A. Wucher: Surf. Interf. Anal. 23 (1995), 393-398 full pdf file

 

 

38.

Relative Elemental Sensitivity Factors in Non-Resonant Laser-SNMS
M. Wahl, D. Koch, W. Berthold and A. Wucher: Fres. J. Anal. Chem. 353 (1995), 354-359 full pdf file

 

 

37.

Rotational and vibrational excitation of sputtered silver dimers
A. Wucher: Proceedings of the International Conference on Resonance Ionization Spectroscopy RIS-94, Bernkastel-Kues, Germany 1994, eds. H.-J. Kluge, J.E. Parks, K. Wendt (AIP Press 1995), p. 437-440 full pdf file

 

 

36.

VUV photoionization of sputtered neutral silver clusters
 M. Wahl and A. Wucher: Nucl. Instr. Meth. B 94 (1994), 36-46 full pdf file

 

 

35.

Electron impact and single photon ionization cross sections of neutral silver
clusters

D. Koch, M. Wahl and A. Wucher: Z. Phys.
D 32 (1994), 137-144 full pdf file

 

 

34.

The charge state of sputtered metal clusters
A. Wucher, M. Wahl and H. Oechsner: SIMS IX (Proceedings of the SIMS 9
conference, Yokohama, Japan 1993),eds. A. Benninghoven, Y. Nihei, R. Shimizu,
H.W. Werner, Whiley 1994, p.100-103
full pdf file

 

 

33.

Detection of sputtered metastable atoms by autoionization
A. Wucher, W. Berthold, H. Oechsner and K. Franzreb: Phys.
Rev. A 49 (1994),
2188-2190
full pdf file

 

 

32.

Yields of sputtered metal clusters: the influence of surface structure
 A. Wucher, Z. Ma, W.F. Calaway and M.J. Pellin: Surf. Sci.
Lett. 304 (1994),
 L439-L444
full pdf file

 

 

31.

Internal energy of sputtered metal clusters
A. Wucher: Phys.
Rev. B 49 (1994), 2012-2020 full pdf file

 

 

30.

The mass distribution of sputtered metal clusters II. Model calculation
A. Wucher: Nucl. Instr. Meth.
B 83 (1993), 79-86 full pdf file

 

 

29.

The mass distribution of sputtered metal clusters I. Experiment
A. Wucher, M. Wahl and H. Oechsner: Nucl.
Instr. Meth. B 83 (1993),
73-78
full pdf file

 

 

28.

Sputtered Neutral Silver Clusters up to Ag18
A. Wucher, M. Wahl and H. Oechsner: Nucl. Instr. Meth. B 82 (1993),
337-346
full pdf file

 

 

27.

Ro-Vibrational population of sputtered metal dimers: The influence of unimolecular
decomposition

A. Wucher and B.J. Garrison: Nucl.
Instr. Meth. B 82 (1993), 352-355 full pdf file

 

 

26.

Microanalysis of Solid Surfaces by Secondary Neutral Mass Spectrometry
A. Wucher: Fres. J. Anal.
Chem. 346 (1993), 3-10 full pdf file

 

 

25.

Characterization of the Fluxes of Neutral and Positively Charged Clusters
Produced by Argon Ion Sputtering of Silver

K. Franzreb, A. Wucher and H. Oechsner: Z. Phys.
D 26 (1993),
101-103
full pdf file

 

 

24.

Formation of Neutral and Positively Charged Clusters during Sputtering of Silver
K. Franzreb, A. Wucher and H. Oechsner: Surf. Sci.
Lett. 279 (1992), L225-L230 full pdf file

 

 

23.

Unimolecular Decomposition in the Sputtering of Metal Clusters
A. Wucher and B.J. Garrison: Phys.
Rev. B 46 (1992) 4855-4864 full pdf file

 

 

22.

Energy Dependent Studies of Anisotropic Atomic Sputtering of Ni(111)
A. Wucher, M. Watgen, C. Mößner, H. Oechsner and B.J. Garrison: Nucl. Instr. Meth. B67 (1992), 531-535
full pdf file

 

 

21.

Internal and Translational Energy of Sputtered Silver Dimers: A Molecular Dynamics Study
A. Wucher and B.J. Garrison: Nucl. Instr. Meth. B67 (1992), 518-522
full pdf file

 

 

20.

Sputtering of Silver Dimers: A Molecular Dynamics Calculation Using a Many-Body Embedded-Atom Potential
A. Wucher and B.J. Garrison: Surf. Sci 260 (1992), 257-266
full pdf file

 

 

19.

Formation of Secondary Cluster Ions during Sputtering of Silver and Copper
K. Franzreb, A. Wucher and H. Oechsner: Phys. Rev. B 43 (1991), 14396-14399
full pdf file

18.

Saturation and Fragmentation in Non Resonant Laser Postionization of Sputtered Atoms and Molecules
K. Franzreb, A. Wucher and H. Oechsner: Fres. J. Anal. Chem. 341 (1991), 7-11
full pdf file

17.

Absolute Cross Section for Electron Impact Ionization of Ag2
K. Franzreb, A. Wucher and H. Oechsner: Z. Phys. D19 (1991), 77-79
full pdf file

16.

Electron Impact Ionization of Small Silver and Copper Clusters
K. Franzreb, A. Wucher and H. Oechsner: Z. Phys. D17 (1990), 51-56 full pdf file

15.

Absolute Depth Profiling of Thin Film Systems by Low Energy Secondary Neutral Mass Spectrometry
A. Wucher, H. Oechsner and F. Novak: Thin Solid Films 174 (1989), 133-137
full pdf file

14.

Calibration of SNMS Depth Profile Analysis
A. Wucher and H. Oechsner: "Plasma Surface Engineering", ed.E. Broszeit, W.D. Münz, H. Oechsner, K.-T. Rie, G.K. Wolf, DGM Informationsgesellschaft Verlag, Oberursel 1989, p. 737-738
full pdf file

13.

Depth Scale Calibration During Sputter Removal of Multilayer Systems by SNMS
A. Wucher and H. Oechsner: Fresenius J. Anal. Chem. 333 (1989), 470-473
full pdf file

12.

Charakterisierung technischer Oberflächen für Anwendungen in der mittelständischen Industrie
H. Oechsner, G. Bachmann, K.H. Müller and A. Wucher: VDI Technologiezentrum Physikalische Technologien, Statusseminar Dünnschichttechnologien Köln 1988, Tagungsband S. 4.1

11.

Emission Energy Dependence of Ionization Probabilities in Secondary Ion Emission from Oxygen covered Ta, Nb and Cu Surfaces
A. Wucher and H. Oechsner: Surf. Sci.199 (1988), 567-578
full pdf file

10.

Energy dependent Ionization Probabilities for Atomic Secondary Ions
A. Wucher and H. Oechsner: Secondary Ion Mass Spectrometry SIMS VI, ed. A. Benninghoven, A.M. Huber, H.W. Werner, Whiley & Sons, Chichester 1988, p. 143-146
full pdf file

 

 

09.

Quantitation of Molecular SNMS Signals
M. Kopnarski, A. Wucher and H. Oechsner: Secondary Ion Mass Spectrometry SIMS VI, ed. A. Benninghoven, A.M. Huber, H.W. Werner, Whiley & Sons, Chichester 1988, p. 849-852
full pdf file

 

08.

Calculation of Post-Ionization Probabilities as a Function of Plasma Parameters in Electron Gas SNMS
A. Wucher: J. Vac. Sci. Technol. A6 (1988), 2287-2292
full pdf file

07.

Angular Distributions of Particles Sputtered from Metals and Alloys
A. Wucher and W. Reuter: J. Vac. Sci. Technol. A6 (1988), 2316-2318
full pdf file

 

06.

Plasma Studies on the Leybold-Heraeus INA 3 SNMS-System
A. Wucher: J. Vac. Sci. Technol. A6 (1988), 2293-2298
full pdf file

 

05.

Relative Sensitivity Factors in Secondary Neutral Mass Spectrometry SNMS
A. Wucher, F. Novak and W. Reuter: J. Vac. Sci. Technol. A6 (1988), 2265-2270
full pdf file

 

 

04.

Absolute Ionization probabilities in Secondary Ion Emission from Clean Metal Surfaces
A. Wucher and H. Oechsner: Proc. of 21st Annual Conference of the Microbeam Analysis Society 1986, ed. A. D. Romig jr. and W. F. Chambers, San Francisco Press 1986, p. 79-81
full pdf file

 

03.

Energy Distributions of Metal Atoms and Monoxide Molecules Sputtered from Oxidized Ta and Nb
A. Wucher and H. Oechsner: Nucl. Instr. Meth. B18 (1987), 458-463
full pdf file

02.

Quantitative Analysis of Thin Oxide and Nitride Layers on Tantalum by Sputtered Neutral Mass Spectrometry
H. Oechsner and A. Wucher: Thin Solid Films 90 (1982), 327-328
full pdf file

 

 

01.

Quantitative Analysis of Thin Oxide Layers on Tantalum by Sputtered Neutral Mass Spectrometry (SNMS)
H. Oechsner and A. Wucher: Applicat. Surf. Sci. 10 (1982), 342-348 
full pdf file